Optical properties of excimer laser nanostructured silicon wafer

dc.contributor.author Kumar, Prashant
dc.contributor.author Krishna, M. Ghanashyam
dc.contributor.author Bhattacharya, A. K.
dc.date.accessioned 2022-03-27T06:57:25Z
dc.date.available 2022-03-27T06:57:25Z
dc.date.issued 2009-11-30
dc.description.abstract KrF excimer laser nanostructuring of [311] single crystal silicon surface is reported for laser fluence above ablation threshold for silicon. Laser irradiation of silicon surface gives rise to growth of nano-sized grains. Cooling time between the shots is an important factor in determining the nanostructures, apart from the number of shots and the laser fluence. Such nanostructured silicon surfaces become highly absorbing and photoluminescent and these peaks can be tuned by laser dressing parameters. © 2009 American Institute of Physics.
dc.identifier.citation AIP Conference Proceedings. v.1147
dc.identifier.issn 0094243X
dc.identifier.uri 10.1063/1.3183439
dc.identifier.uri http://aip.scitation.org/doi/abs/10.1063/1.3183439
dc.identifier.uri https://dspace.uohyd.ac.in/handle/1/10637
dc.subject Excimer laser nanostructuring
dc.subject Photoluminescence
dc.title Optical properties of excimer laser nanostructured silicon wafer
dc.type Conference Proceeding. Conference Paper
dspace.entity.type
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