Thermal Stability Analysis of Graded-Channel Dual-Material Double-Gate (GCDMDG) MOSFET for Analog Application

dc.contributor.author Priya, Anjali
dc.contributor.author Gupta, Abhinav
dc.contributor.author Agrawal, Neha
dc.contributor.author Rai, Sanjeev
dc.contributor.author Mishra, Ram Awadh
dc.date.accessioned 2022-03-27T06:41:40Z
dc.date.available 2022-03-27T06:41:40Z
dc.date.issued 2022-01-01
dc.description.abstract In this paper, thermal stability analysis of graded-channel dual-material double-gate (GCDMDG) MOSFET has been discussed in terms of analog and RF performances. Analog and RF characteristics have been analyzed at different temperature (200–500 K) to find thermal stability point. The device performance has been examined with major performance parameters. This analysis has been done on the 2D TCAD simulator of Silvaco ATLAS. It is seen that the stability point for all the parameters lies in the range of gate voltage 0.5–0.8 V. Further, a common source amplifier with diode connected load has been designed using GCDMDG MOSFET. A higher amplification gain has been achieved with the device, when used as common source amplifier. This paper provides a unique attempt to explore the thermal stability and analog applications of double-gate MOSFETs.
dc.identifier.citation Lecture Notes in Electrical Engineering. v.777
dc.identifier.issn 18761100
dc.identifier.uri 10.1007/978-981-16-2761-3_20
dc.identifier.uri https://link.springer.com/10.1007/978-981-16-2761-3_20
dc.identifier.uri https://dspace.uohyd.ac.in/handle/1/9745
dc.subject Common source amplifier
dc.subject Dual material
dc.subject Graded-channel MOSFET
dc.subject Thermal stability point
dc.title Thermal Stability Analysis of Graded-Channel Dual-Material Double-Gate (GCDMDG) MOSFET for Analog Application
dc.type Book Series. Conference Paper
dspace.entity.type
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