Optical and microwave properties of CaBi < inf > 4 < /inf > Ti < inf > 4 < /inf > O < inf > 15 < /inf > ferroelectric thin films deposited by pulsed laser deposition

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dc.contributor.author Emani, Sivanagi Reddy
dc.contributor.author Joseph, Andrews
dc.contributor.author Raju, K. C.James
dc.date.accessioned 2022-03-27T11:42:04Z
dc.date.available 2022-03-27T11:42:04Z
dc.date.issued 2016-05-23
dc.description.abstract Transparent CaBi4Ti4O15 (CBTi) ferroelectric thin films are deposited by pulsed laser deposition method. The structural, optical and microwave dielectric properties were investigated. CBTi thin films had polycrystalline bismuth-layered perovskite structure and exhibited excellent optical properties. The X-ray analysis of the thin film demonstrates the phase formation and crystallinity. The optical transmission studies show that film is transparent in VIS-NIR region with a direct band gap of 3.53 EV. Morphological studies provide surface roughness as 3 mm. Dielectric constant and loss factors were 48 and 0.060 respectively, at 10GHz. These results suggest that CBTi thin films are promising multifunctional materials for applications in optoelectronic and microwave devices.
dc.identifier.citation AIP Conference Proceedings. v.1731
dc.identifier.issn 0094243X
dc.identifier.uri 10.1063/1.4947893
dc.identifier.uri http://aip.scitation.org/doi/abs/10.1063/1.4947893
dc.identifier.uri https://dspace.uohyd.ac.in/handle/1/14511
dc.subject CaBi Ti O thin film 4 4 15
dc.subject Microwave dielectrics
dc.subject Optical properties
dc.subject Pulsed laser deposition
dc.title Optical and microwave properties of CaBi < inf > 4 < /inf > Ti < inf > 4 < /inf > O < inf > 15 < /inf > ferroelectric thin films deposited by pulsed laser deposition
dc.type Conference Proceeding. Conference Paper
dspace.entity.type
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