Band gap determination using Tauc's plot for LiNbO < inf > 3 < /inf > thin films

dc.contributor.author Tumuluri, Anil
dc.contributor.author Lakshun Naidu, K.
dc.contributor.author James Raju, K. C.
dc.date.accessioned 2022-03-27T11:43:09Z
dc.date.available 2022-03-27T11:43:09Z
dc.date.issued 2014-01-01
dc.description.abstract LiNbO3 thin films were deposited using RF magnetron sputtering technique. Structural studies confirmed the formation of LiNbO3 phase with minor Li deficiency. The RMS roughness and average grain size of the crystallized thin films was found to be in the range of 5.74 -26nm and 26 -152nm respectively. From Tauc's plot, it can be seen that the band gap energy is decreasing with increase in annealing temperature till 700 °C. At 750 °C, band gap is shifted towards blue end. The variation in band gap is primarily due to the Li vacancies and grain size effects which are explained by quantum confinement model.
dc.identifier.citation International Journal of ChemTech Research. v.6(6 SPEC. ISS.)
dc.identifier.issn 09744290
dc.identifier.uri https://dspace.uohyd.ac.in/handle/1/14559
dc.title Band gap determination using Tauc's plot for LiNbO < inf > 3 < /inf > thin films
dc.type Journal. Conference Paper
dspace.entity.type
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