Ion beam characterization and engineering of strain in semiconductor multilayers
Ion beam characterization and engineering of strain in semiconductor multilayers
| dc.contributor.advisor | Pathak, A.P. | |
| dc.contributor.author | Nageswara Rao, S.V.S. | |
| dc.date.accessioned | 2017-04-04T05:29:11Z | |
| dc.date.accessioned | 2022-03-03T04:53:16Z | |
| dc.date.available | 2017-04-04T05:29:11Z | |
| dc.date.available | 2022-03-03T04:53:16Z | |
| dc.date.issued | 2002-12-20 | |
| dc.identifier.uri | https://dspace.uohyd.ac.in/handle/1/968 | |
| dc.language.iso | en | en_US |
| dc.publisher | University of Hyderabad | en_US |
| dc.relation.ispartofseries | TH3334; | |
| dc.subject | Physics | en_US |
| dc.title | Ion beam characterization and engineering of strain in semiconductor multilayers | en_US |
| dc.type | Thesis | en_US |
| dspace.entity.type |