Ion beam modifications and characterisation of semiconductor heterostructures

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dc.contributor.author Siddiqui, Azher M.
dc.contributor.author Dhamodaran, S.
dc.contributor.author Nageswara Rao, S. V.S.
dc.contributor.author Sathish, N.
dc.contributor.author Pathak, Anand P.
dc.date.accessioned 2022-03-27T06:42:49Z
dc.date.available 2022-03-27T06:42:49Z
dc.date.issued 2004-12-01
dc.description.abstract Strained Layer Superlattices (SLS) have unique electronic and opto-electronic properties and find wide ranging applications in many frontier areas of science and technology. This paper reviews the experimental work on the characterisation and Swift Heavy Ion (SHI) induced modifications on semiconductor heterostructures. An overview of our experiments namely, Rutherford Backscattering Spectrometry/Channelling, Elastic Recoil Detection Analysis, High Resolution X-Ray Diffraction and Ion Beam Mixing, will be discussed. Copyright ©2004 by Society for Advancement of Heat Treatment & Surface Engineering (SAHTSE).
dc.identifier.citation Proceedings of the International Conference on Advances in Surface Treatment: Research and Applications, ASTRA. v.2004
dc.identifier.uri https://dspace.uohyd.ac.in/handle/1/9869
dc.title Ion beam modifications and characterisation of semiconductor heterostructures
dc.type Conference Proceeding. Conference Paper
dspace.entity.type
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