Ion beam studies of pure and nanoparticle (Si, Ag) embedded HfO2, thin films
Ion beam studies of pure and nanoparticle (Si, Ag) embedded HfO2, thin films
| dc.contributor.advisor | Pathak, A.P. | |
| dc.contributor.author | Dhanunjaya, Munthala | |
| dc.date.accessioned | 2020-02-24T04:34:35Z | |
| dc.date.accessioned | 2022-03-03T04:52:34Z | |
| dc.date.available | 2020-02-24T04:34:35Z | |
| dc.date.available | 2022-03-03T04:52:34Z | |
| dc.date.issued | 2018-05-30 | |
| dc.identifier.uri | https://dspace.uohyd.ac.in/handle/1/878 | |
| dc.language.iso | en | en_US |
| dc.publisher | University of Hyderabad | en_US |
| dc.relation.ispartofseries | TH11043; | |
| dc.subject | Physics | en_US |
| dc.title | Ion beam studies of pure and nanoparticle (Si, Ag) embedded HfO2, thin films | en_US |
| dc.type | Thesis | en_US |
| dspace.entity.type |