Synthesis and properties of zirconia thin films

dc.contributor.author Suhail, M. H.
dc.contributor.author Krishna, M. Ghanashyam
dc.contributor.author Rao, G. Mohan
dc.contributor.author Mohan, S.
dc.date.accessioned 2022-03-27T06:40:59Z
dc.date.available 2022-03-27T06:40:59Z
dc.date.issued 1994-11-01
dc.description.abstract Thin films of zirconia have been synthesized using reactive DC magnetron sputtering. It has been found that films with good optical constants, high refractive index (1·9 at 600 nm) and low extinction coefficient can be prepared at ambient temperatures. The optical constants and band gap and hence the composition are dependent on the deposition parameters such as target power, rate of deposition and oxygen background pressure. Thermal annealing of the films revealed that the films showed optical and crystalline inhomogeneity and also large variations in optical constants. © 1994 Indian Academy of Sciences.
dc.identifier.citation Bulletin of Materials Science. v.17(6)
dc.identifier.issn 02504707
dc.identifier.uri 10.1007/BF02757563
dc.identifier.uri http://link.springer.com/10.1007/BF02757563
dc.identifier.uri https://dspace.uohyd.ac.in/handle/1/9660
dc.subject Magnetron sputtering
dc.subject zirconia
dc.title Synthesis and properties of zirconia thin films
dc.type Journal. Article
dspace.entity.type
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