Linear and nonlinear optical properties of SrBi < inf > 4 < /inf > Ti < inf > 4 < /inf > O < inf > 15 < /inf > thin films

Abstract

Polycrystalline SrBi4Ti4O15 thin films with good morphology and layered perovskite structure were fabricated on fused silica substrates using r f magnetron sputtering system at various oxygen mixing percentages (25 and 50). The crystallite sizes of the particles are in 17-28 nm range. The Nonlinear optical properties were investigated by using Z-scan method at a wavelength of 800 nm with 2 ps duration pulses. The films exhibit the fast and giant optical nonlinearities having the two-photon absorption coefficient (β) with magnitude of 10-8-10-9 cm/W and the nonlinear refraction coefficient of ∼10-12 cm2/W. These results indicate SrBi4Ti4O15 thin films are promising candidates for applications in nonlinear optical and optical signal processing devices.