Morphological and optical properties of wurtzite ZnTe thin films

Abstract

The morphological and optical properties of wurtzite ZnTe films prepared by electron beam evaporation are reported. Electron diffraction studies confirmed that the films were stabilized in the wurtzite structure. The optical properties of these films such as spectral transmittance, refractive index and energy gap have been studied in the UV-Vis-NIR region. The optical band gap was recorded to be 0.9 eV while refractive index was found to be 3.87 at 2000 nm. The morphology as studied using atomic force microscopy showed close-packed columnar grain morphology. © 2011 American Institute of Physics.