Morphological and optical properties of wurtzite ZnTe thin films

dc.contributor.author	Kshirsagar, Sachin D.
dc.contributor.author	Krishna, M. Ghanashyam
dc.contributor.author	Tewari, Surya P.
dc.date.accessioned	2022-03-27T06:53:42Z
dc.date.available	2022-03-27T06:53:42Z
dc.date.issued	2011-09-12
dc.description.abstract	The morphological and optical properties of wurtzite ZnTe films prepared by electron beam evaporation are reported. Electron diffraction studies confirmed that the films were stabilized in the wurtzite structure. The optical properties of these films such as spectral transmittance, refractive index and energy gap have been studied in the UV-Vis-NIR region. The optical band gap was recorded to be 0.9 eV while refractive index was found to be 3.87 at 2000 nm. The morphology as studied using atomic force microscopy showed close-packed columnar grain morphology. © 2011 American Institute of Physics.
dc.identifier.citation	AIP Conference Proceedings. v.1349(PART A)
dc.identifier.issn	0094243X
dc.identifier.uri	10.1063/1.3606337
dc.identifier.uri	http://aip.scitation.org/doi/abs/10.1063/1.3606337
dc.identifier.uri	https://dspace.uohyd.ac.in/handle/1/10492
dc.subject	Electron beam evaporation
dc.subject	Optical constants
dc.subject	Optical materials
dc.subject	Optical properties
dc.subject	Thin films
dc.title	Morphological and optical properties of wurtzite ZnTe thin films
dc.type	Conference Proceeding. Conference Paper
dspace.entity.type

Now showing 1 - 1 of 1